发明名称 EQUIPMENT FOR FORMING SEMICONDUCTOR DEVICE AND METHOD OF FORMING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an equipment and a method for excellently performing a reflow process for reducing the imperfect operation of an FET which is to be caused by imperfect contact. SOLUTION: This equipment of forming a semiconductor is provided with at least a first reaction chamber 105 and a second reaction chamber 108 which can independently control atmosphere, have air-tightness, and are linked with each other. In the first reaction chamber 105, a film of aluminum or a film whose main component is aluminum is formed by a sputtering method. In the second reaction chamber 108, heat treatment is performed, and fluidity is imparted to at least a part of the film of aluminum or the film whose main component is aluminum.
申请公布号 JPH1070089(A) 申请公布日期 1998.03.10
申请号 JP19970120378 申请日期 1997.04.23
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 C23C14/14;C23C14/56;C23C14/58;C23C16/06;H01L21/203;H01L21/28;H01L21/285;H01L21/3205;H01L21/336;H01L21/677;H01L21/68;H01L23/52;H01L29/786;(IPC1-7):H01L21/285;H01L21/320 主分类号 C23C14/14
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