发明名称 X-RAY DIAGNOSTIC SYSTEM
摘要 PROBLEM TO BE SOLVED: To enable scattered ray correction by collecting energy spectra for each cell or each cell group based on the outputs of semiconductor cells concerning the plural semiconductor cells for directly converting X-rays transmitted through a reagent to electric signals. SOLUTION: A waveheight analyzer 6 having a semiconductor cell array 4 is provided with input terminals as many as the semiconductor cells and constituted so as to individually input the outputs of the respective plural semiconductor cells. The waveheight analyzer 6 distinguish an energy window corresponding to the micro waveheight value of an output signal from an image pickup unit 3 and generates one pulse in the correspondent output terminal. During the period of X-ray radiation, this distinguishing work is repeated with high timewise resolution. An energy spectrum collection part 7 counts the number of these output pulses and collects/analyzes the energy spectra for each cell. These energy spectra are turned to image data by an image generating part 9 and displayed on a display unit 10. Thus, the high-contrast image data with a little mixture of scattered rays can be provided.
申请公布号 JPH1033518(A) 申请公布日期 1998.02.10
申请号 JP19960197583 申请日期 1996.07.26
申请人 TOSHIBA CORP 发明人 YAMAKAWA TSUTOMU
分类号 G01T1/24;A61B6/00;(IPC1-7):A61B6/00 主分类号 G01T1/24
代理机构 代理人
主权项
地址