Verfahren zur Testung einer Übertemperaturerkennung in einem integrierten Schaltkreis,申请号DE19951024616-传众专利搜索

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发明名称	Verfahren zur Testung einer Übertemperaturerkennung in einem integrierten Schaltkreis
摘要
申请公布号	DE19524616(C2)	申请公布日期	1998.02.05
申请号	DE19951024616	申请日期	1995.07.06
申请人	TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILBRONN, DE	发明人	ECKSTEIN, WOLFGANG, DIPL.-ING. (FH), 74182 OBERSULM, DE;WIRTH, JENS, DIPL.-ING. (FH), 74199 UNTERGRUPPENBACH, DE
分类号	G01R31/28;H02J7/00;(IPC1-7):H01L23/62;H01M10/50;G01R31/36	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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