发明名称 Wafer-Poliermaschine
摘要 A semiconductor wafer is held by a wafer mount plate, which is loosely inserted into a housing. An air chamber is formed between the wafer mount plate and the housing. A retainer ring encloses the semiconductor wafer, and the semiconductor wafer as well as the retainer ring contacts with a polishing pad. An roughness is formed at the bottom of the retainer ring so as to dress the polishing pad. Polishing liquid is supplied to the inside of the retainer ring. Thus, the polishing pressure can be uniformly applied and the polishing liquid can be uniformly supplied on the whole surface of the semiconductor wafer, and the polishing for the semiconductor wafer and the dressing for the polishing pad can be performed at the same time.
申请公布号 DE19732175(A1) 申请公布日期 1998.02.05
申请号 DE1997132175 申请日期 1997.07.25
申请人 TOKYO SEIMITSU CO. LTD., MITAKA, TOKIO/TOKYO, JP 发明人 INABA, TAKAO, MITAKA, TOKIO/TOKYO, JP;OGURI, MASAAKI, MITAKA, TOKIO/TOKYO, JP;SAKAI, KENJI, MITAKA, TOKIO/TOKYO, JP;NUMOTO, MINORU, MITAKA, TOKIO/TOKYO, JP;TERASHITA, HISASHI, MITAKA, TOKIO/TOKYO, JP
分类号 B24B37/00;B24B37/005;B24B37/04;B24B37/30;B24B37/32;B24B53/00;B24B53/017;B24B57/02;H01L21/304;H01L21/306;(IPC1-7):H01L21/304;H01L21/68;B24B7/16 主分类号 B24B37/00
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