发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE AND MEMORY CELL STRUCTURE
摘要 PROBLEM TO BE SOLVED: To reduce the resistance value of memory node. SOLUTION: In a trench-type memory cell, a second conductive material 107 other than polysilicon is buried in a memory node besides a first conductive material (polysilicon). One element selected out of WSi, TiSi, W, Ti, and TiN is used as the second conductive material. The added conductive material serves to enable a memory node to be lessened in resistance and sense delay and improved in access speed. By this setup, a memory cell of 256 megabits or above can be easily realized.
申请公布号 JPH1027885(A) 申请公布日期 1998.01.27
申请号 JP19970089373 申请日期 1997.04.08
申请人 TOSHIBA CORP 发明人 NITAYAMA AKIHIRO;TANIMOTO KOKICHI
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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