发明名称 X-RAY TYPE FOREIGN MATTER INSPECTING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To effectively correct fluctuation of X-ray intensity of an X-ray source even if a material to be inspected is passed through an end of an X-ray detector. SOLUTION: Outputs of respective channels of X-ray sensors 4 are sequentially transferred, subjected to offset removal by an offset sensitivity compensation circuit 10 and sensitivity irregularity compensation, and then input to a correcting circuit 13. Then, only three channels of both ends of the sensors are, for example, input to an average value calculation circuit 11, an average value of each both ends is calculated, and validity of data of each both ends is judged by a judging circuit 12 according to the average value. On the other hand, the circuit 13 corrects the outputs of the respective channels of the sensors in response to the validity of the data of both the ends of the sensors, and sent to a signal processing circuit 14 of next stage. The circuit 14 forms an X-ray transmission image by using the output of the circuit 13, and a TV monitor displays it. A threshold value is automatically set on the basis of the output. If the output signal is larger than the threshold value, presence of a foreign matter is judged, and an alarm is generated.</p>
申请公布号 JPH1026592(A) 申请公布日期 1998.01.27
申请号 JP19960180731 申请日期 1996.07.10
申请人 SHIMADZU CORP 发明人 SAWADA RYOICHI
分类号 G01N23/04;G01N23/18;G01V5/00;(IPC1-7):G01N23/18 主分类号 G01N23/04
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