X-RAY EXAMINATION APPARATUS WITH A SEMICONDUCTOR X-RAY DETECTOR

摘要

An x-ray examination apparatus comprises an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector comprises a semiconductor element comprising one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.