发明名称 APPARATUS AND METHOD FOR MEASURING GASES USING A HEATED GAS PROBE AND CLOSELY COUPLED MEASUREMENT CHAMBER
摘要 <p>An apparatus comprising an extraction probe and measurement chamber measures gas concentrations directly at the gas extraction site without diluting the sampled gases, while keeping the gas heated to a temperature above 500 °F. The probe is insertable into a stream of a high temperature gas composition and includes a tip section (17) for receiving an extracted sample and a heated extraction section (18). The tip section (17) includes a filter (16) for removing particles from the sample. The heated measurement chamber (15) is coupled to the proximal end of the probe for receiving the extracted sample from the heated extraction section (18). The heated measurement chamber (15) includes a measurement device for measuring concentrations of gases within the sample. The measurement device can comprise an athermal optical multipass cell (e.g., a Herriot cell).</p>
申请公布号 WO1997049979(A1) 申请公布日期 1997.12.31
申请号 US1997010883 申请日期 1997.06.23
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