PICTURE INSPECTING METHOD AND ITS DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a picture inspecting method and a device applying the method, by which a picture inspection can be performed by reliably correcting positional deviation in a short time with respect to wide inspecting conditions and inspecting object. SOLUTION: With respect to the data string of a reference picture corresponding to m-number of line segments at prescribed positions on a reference picture, the data string of an inspecting objective picture corresponding to n-number of adjacent line segments including the line segments at the same positions as them on the inspecting objective picture. The evaluating numerical value of coincidence is calculated concerning them and positional deviation is corrected based on positional data on the data string of the inspecting objective picture providing the evaluating numerical value of maximum coincidence and positional data on the data string of the reference picture to compare the reference picture and the inspecting objective picture.