METHOD AND DEVICE FOR MEASURING DELAY TIME

摘要

PROBLEM TO BE SOLVED: To measure a delay time in which the influence of the operation of the other measuring circuit, which is not direct target of measurement, is reflected when the delay time of a circuit to be measured is measured. SOLUTION: An input signal latched by a clock signal CK1 is inputted to one circuit to be measured selected from a circuit group to be measured CK1-CK15, and inputted to another or a plurality of the circuits to be measured. The output signal of the above one circuit to be measured is latched by a clock signal CK2, and the delay time of the above one circuit to be measured is measured in a state in which another or a plurality of the circuits to be measured is measured.