发明名称 DEVICE FOR CONTROLLING THICKNESS AND METHOD FOR CONTROLLING THICKNESS
摘要 <p>PROBLEM TO BE SOLVED: To realize a highly accurate gaugemeter formula and to improve the accuracy of thickness control by estimating the error in gaugemeter thickness at each rolling stand by using the measured value of a thickness gage and continuously correcting the gaugemeter formula at each rolling stand. SOLUTION: In a gaugemeter thickness arithmetic unit 11 of the rolling stands 1, 2, the gaugemeter thickness is calculated over the entire length of a material W to be rolled during rolling based on rolling load and the opening degree of roll. In a mass flow thickness rithmetic unit 12 of the final rolling stand 1, the mass flow thickness is calculated over the entire length after the tip of the material W to be rolled reaches the thickness gage 3 by the mass flow formula from the speed of a rolled stock and actual thickness. In a device 10 for calculating the error in the gaugemeter thickness, the error in the gaugemeter thickness is calculated from the gaugemeter thickness and the mass flow thickness and, in an arithmetic unit 13 for gaugemeter correction, the gaugemeter correction value is decided based on the calculated error in gaugemeter thickness. In a thickness controller 5, the opening-degree control of the rolling roll is executed by adding the correction value to the gaugemeter thickness.</p>
申请公布号 JPH09323112(A) 申请公布日期 1997.12.16
申请号 JP19960141984 申请日期 1996.06.04
申请人 MITSUBISHI ELECTRIC CORP 发明人 WAKAMIYA NOBUNORI;KUBO NAOHIRO;IZEKI YASUTO
分类号 B21B37/18;(IPC1-7):B21B37/18 主分类号 B21B37/18
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