发明名称 SRAM cell employing substantially vertically elongated pull-up resistors
摘要 An SRAM cell having at least four field effect transistors includes, a) at least four transistor gates, a ground line, a Vcc line, and a pair of pull-up resistors; the four transistor gates having associated transistor diffusion regions operatively adjacent thereto; and b) the Vcc line and the ground line being provided in different respective elevational planes, the pull-up resistors being substantially vertically elongated between Vcc and selected of the respective transistor diffusion regions operatively adjacent the gates. In an additional aspect, an SRAM cell having at least four field effect transistors includes, i) at least four transistor gates, an electrical interconnect line, a Vcc line, and a pair of pull-up resistors; the four transistor gates having associated transistor diffusion regions operatively adjacent thereto; and ii) the Vcc line and the electrical interconnect line being provided in different respective elevational planes, the pull-up resistors being substantially vertically elongated between Vcc and selected of the respective transistor diffusion regions operatively adjacent the gates.
申请公布号 US5699292(A) 申请公布日期 1997.12.16
申请号 US19960705589 申请日期 1996.08.29
申请人 MICRON TECHNOLOGY, INC. 发明人 ROBERTS, CEREDIG
分类号 H01L27/11;(IPC1-7):H01L27/02 主分类号 H01L27/11
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