发明名称 Verfahren und Vorrichtung zur Herstellung von Einkristallen
摘要 In a silicon single crystal production process, the novelty is that (a) the growing crystal is held at 850-1100 degrees C for more than 250 minutes or for less than 80 minutes; or (b) the cooling rate of the growing crystal is controlled by a surrounding heat shield which is subdivided, between its upper and lower edges, into annular zones of different thermal conductivities and radiant heat permeabilities, the lower edge zone preferably having an emission coefficient of 0.3-0.9 and a heat conduction coefficient of 0.02-5 W/m.K. Also claimed is a silicon single crystal production apparatus including a heat shield surrounding the growing crystal.
申请公布号 DE19622664(A1) 申请公布日期 1997.12.11
申请号 DE1996122664 申请日期 1996.06.05
申请人 WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG, 84489 BURGHAUSEN, DE 发明人 AMMON, WILFRIED V., DR., 84489 BURGHAUSEN, DE;DORNBERGER, ERICH, DIPL.-ING., 84489 BURGHAUSEN, DE;OELKRUG, HANS, DR., 84529 TITTMONING, DE;GRAEF, DIETER, DR., 84489 BURGHAUSEN, DE
分类号 C30B15/00;C30B15/14;C30B15/20;C30B29/06;H01L21/208;(IPC1-7):C30B15/20 主分类号 C30B15/00
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