发明名称 METHOD OF SEMICONDUCTOR DEVICE WIRING
摘要 Form an interlayer insulating film(3) and the first metal contact hole by removing the insulating film selectively by the process of photo etching. Install a tungsten(4) plug within the contact hole. Vaporize over all area with the first metal(5) to be connected with the tungsten plug. Form the first interlayer metal insulating film on the first metal. Remove selectively the first interlayer metal insulating film(7) by means of photoetching process, using a photosensitive film(6), and make the second metal contact hole. With the second metal contact hole, create a tungsten plug(8).
申请公布号 KR0124631(B1) 申请公布日期 1997.12.10
申请号 KR19940004592 申请日期 1994.03.09
申请人 LG SEMICONDUCTOR CO.,LTD 发明人 NOH, JAE-SUNG;PARK, JOO-SUK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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