发明名称 |
Laser beam analyzer |
摘要 |
A device for sampling a section of a laser beam using an elongated reflective element that is moved in a main direction that corresponds to the direction of elongation of the element and in a direction perpendicular to the main direction. This sampling device forms a part of a laser beam analyzer and provides a small reflected beam segment to the analyzer that corresponding to the part of the laser beam that impinges upon the moving elongated reflecting element.
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申请公布号 |
US5694209(A) |
申请公布日期 |
1997.12.02 |
申请号 |
US19950531605 |
申请日期 |
1995.09.21 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE |
发明人 |
ALFILLE, JEAN-PASCAL;RAOUX, JEAN |
分类号 |
G01J1/02;G01J1/42;(IPC1-7):G01J1/42 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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