发明名称 Laser beam analyzer
摘要 A device for sampling a section of a laser beam using an elongated reflective element that is moved in a main direction that corresponds to the direction of elongation of the element and in a direction perpendicular to the main direction. This sampling device forms a part of a laser beam analyzer and provides a small reflected beam segment to the analyzer that corresponding to the part of the laser beam that impinges upon the moving elongated reflecting element.
申请公布号 US5694209(A) 申请公布日期 1997.12.02
申请号 US19950531605 申请日期 1995.09.21
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 ALFILLE, JEAN-PASCAL;RAOUX, JEAN
分类号 G01J1/02;G01J1/42;(IPC1-7):G01J1/42 主分类号 G01J1/02
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