| 摘要 |
A method of manufacturing both bipolar and CMOS devices including vertical PNP, NPN, PMOS and NMOS devices on the same chip, includes the steps of, simultaneously forming an N+ region (14) on part of a P base region (11) of the vertical NPN device to form the emitter contact region thereof, an N+ region (14) on a part of an N- epitaxial layer (5) of the vertical NPN device to form the collector contact region thereof, N+ regions (14) on first and second parts of a P well region (8) of the NMOS device to form the source and drain thereof, and an N+ region (14) on an N base region (9) of the vertical PNP device to form the base contact thereof. In a further simultaneous step, there are formed P+ regions (15) on the P-well (8) and N base (9) regions of the vertical PNP device to form the collector and emitter contact regions thereof, P+ regions (15) on first and second parts of the N- epitaxial layer (5) of the PMOS device to form the source and drain thereof, and a P+ region (15) on part of the P base region (11) of the vertical NPN device to form the base contact region thereof.
|
