发明名称 |
CCD manufacturing method |
摘要 |
The method initially involves depositing one semiconductor layer (35), e.g. of polysilicon, on a substrate, and implanting impurity ions of a given concentration into it. The semiconductor layer is then structured to obtain numerous first gate electrode lines of first width at constant mutual spacing. A second semiconductor layer (38), e.g. also of polysilicon, is deposited on the first gate electrode line and the substrate exposed surface and impurity ions of a lower concentration are implanted into it. The second layer is structured to form second gate electrode lines of a greater width between the first gate electrode lines.
|
申请公布号 |
DE19715684(A1) |
申请公布日期 |
1997.11.20 |
申请号 |
DE19971015684 |
申请日期 |
1997.04.15 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
KIM, YONG-KWAN, CHEONGJU, KR |
分类号 |
H01L27/146;H01L21/339;H01L27/148;H01L29/762;H04N5/335;H04N5/341;H04N5/3728;(IPC1-7):H01L21/339;H01L29/768 |
主分类号 |
H01L27/146 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|