发明名称 CCD manufacturing method
摘要 The method initially involves depositing one semiconductor layer (35), e.g. of polysilicon, on a substrate, and implanting impurity ions of a given concentration into it. The semiconductor layer is then structured to obtain numerous first gate electrode lines of first width at constant mutual spacing. A second semiconductor layer (38), e.g. also of polysilicon, is deposited on the first gate electrode line and the substrate exposed surface and impurity ions of a lower concentration are implanted into it. The second layer is structured to form second gate electrode lines of a greater width between the first gate electrode lines.
申请公布号 DE19715684(A1) 申请公布日期 1997.11.20
申请号 DE19971015684 申请日期 1997.04.15
申请人 LG SEMICON CO., LTD., CHEONGJU, KR 发明人 KIM, YONG-KWAN, CHEONGJU, KR
分类号 H01L27/146;H01L21/339;H01L27/148;H01L29/762;H04N5/335;H04N5/341;H04N5/3728;(IPC1-7):H01L21/339;H01L29/768 主分类号 H01L27/146
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