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发明名称
TESTABLE CIRCUIT AND METHOD OF TESTING
摘要
申请公布号
EP0807259(A1)
申请公布日期
1997.11.19
申请号
EP19960931947
申请日期
1996.10.14
申请人
PHILIPS ELECTRONICS N.V.
发明人
MURIS, MATHIAS, N., M.;DE JONG, FRANCISCUS, G., M.;DE WILDE, JOHANNES;SCHUTTERT, RODGER, F.
分类号
G01R31/28;G01R31/3167;G01R31/3185;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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