| 摘要 |
A test apparatus for generating switch tests, step tests, or digital ramp test signals to be input to an engraving amplifier for off-line testing includes a multiple timing signal generator which is used to supply signals for driving the engraving amplifier, and includes a switch tester for parallel loading selected digital signals for serial conversion and outputting in a serial data stream to the engraving amplifier. A step test facility is also provided whereby a pair of digital values are alternately parallel loaded into a parallel to serial converter and output to an engraving amplifier to provide a digital step stimulus. A ramp test circuit is also provided wherein a counter has its output selectively coupled to one of the parallel to serial converters for supply through a driver to the engraving amplifier to provide a digital ramp signal.
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