发明名称
摘要 To facilitate testing in the manufacture, operation, and maintenance of substrate-supported assemblies such as, e.g., optical transmitters and receivers in subscriber-loop and local-area networks, an assembly is provided with built-in optical test features at selected test points. Preferred test features may include side-by-side couplers or reflector taps as may serve to extract or insert light into a substrate-supported waveguide. Testing may further involve the use of a test set having optical components in alignment with test features of an assembly.
申请公布号 JP2674823(B2) 申请公布日期 1997.11.12
申请号 JP19890050194 申请日期 1989.03.03
申请人 发明人
分类号 G01M11/00;G02B6/12;G02B6/42;H04B10/00 主分类号 G01M11/00
代理机构 代理人
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