发明名称 Method for forming a plug in a semiconductor device
摘要 A method for forming a plug in a semiconductor device comprising the steps of: providing openings which expose an underlying layer through an insulating layer; filling selective metal layers into openings such that one of the selective metal layers is overgrown over the surface of the insulating layer in the opening having a lower topology; forming a photoresist layer on the resulting structure; patterning the photoresist layer to expose the upper surface of the overgrown selective metal layer; removing the upper portion of the overgrown selective metal layer, such that the topology of the overgrown selective metal layers is the same as that of the non-overgrown selective metal layer; and forming a metal wiring connected to the selective metal layers.
申请公布号 US5686358(A) 申请公布日期 1997.11.11
申请号 US19950555789 申请日期 1995.11.09
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 CHOI, KYEONG KEUN
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/467 主分类号 H01L21/28
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