发明名称 METHOD AND DEVICE FOR MEASURING REFLECTED OPTICAL RADIATION
摘要 The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area (26) on an assay matrix (22). The reflectometer includes an optical radiation source (44) and a detector (34). The optical radiation source (44) and the detector (34) are mounted in a single plane. An optics assembly is configured to direct the illumination from the optical radiation source (44) to the sampling area (26) on the assay matrix (22) and to direct the radiation diffusely reflected from the sampling area (26) to the detector (34). The optics assembly is positioned over the face of the circuit board (94) having the optical radiation source (44) and detector (34) mounted directly thereto. The present invention also provides a method for determining the presence of one or more selected analytes in a sample employing a plurality of sampling areas on one or more assay matrices.
申请公布号 WO9741421(A1) 申请公布日期 1997.11.06
申请号 WO1997US07223 申请日期 1997.04.30
申请人 METRIKA LABORATORIES, INC. 发明人 HEBERT, RAYMOND, T.;BLATT, JOEL, M.;WIDUNAS, JOSEPH, T.
分类号 G01N21/47;G01N21/25;G01N21/86;(IPC1-7):G01N21/47 主分类号 G01N21/47
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