发明名称 DEVICE ISOLATION METHOD OF SEMICONDUCTOR
摘要 forming a first oxide film on a semiconductor substrate; forming an oxidation stopper having an open aperture revealing the part where an isolation region is formed on the first oxide film; forming an oxygen ion layer in the substrate by implanting oxygen ion into the front surface of the substrate using the oxidation stopper as a mask; forming a spacer on the side wall of the oxidation stopper; forming a trench by etching the oxygen ion layer using the spacer as an etching mask; thermal-oxidation of the oxygen ion layer by thermal annealing; and forming a second oxide film to fill the trench.
申请公布号 KR0120571(B1) 申请公布日期 1997.10.20
申请号 KR19940009807 申请日期 1994.05.04
申请人 SAMSUNG ELECTRONICS CO.,LTD 发明人 LEE, KYU-PHIL
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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