发明名称 |
DEVICE ISOLATION METHOD OF SEMICONDUCTOR |
摘要 |
forming a first oxide film on a semiconductor substrate; forming an oxidation stopper having an open aperture revealing the part where an isolation region is formed on the first oxide film; forming an oxygen ion layer in the substrate by implanting oxygen ion into the front surface of the substrate using the oxidation stopper as a mask; forming a spacer on the side wall of the oxidation stopper; forming a trench by etching the oxygen ion layer using the spacer as an etching mask; thermal-oxidation of the oxygen ion layer by thermal annealing; and forming a second oxide film to fill the trench.
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申请公布号 |
KR0120571(B1) |
申请公布日期 |
1997.10.20 |
申请号 |
KR19940009807 |
申请日期 |
1994.05.04 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD |
发明人 |
LEE, KYU-PHIL |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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