发明名称 Method for planarizing high step-height integrated circuit structures
摘要 A method for planarizing a high step-height integrated circuit structure within an integrated circuit. There is first formed upon a semiconductor substrate a high step-height integrated circuit structure. Formed then adjoining the high step-height integrated circuit structure is a patterned Global Planarization Dielectric (GPD) layer. There is then formed upon the exposed surfaces of the semiconductor substrate, the high step-height integrated circuit structure and the patterned Global Planarization Dielectric (GPD) layer a reflowable dielectric layer. Finally, the reflowable dielectric layer is reflowed.
申请公布号 US5674773(A) 申请公布日期 1997.10.07
申请号 US19960616897 申请日期 1996.03.15
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 KOH, CHAO-MING;LIU, BIN
分类号 H01L21/3105;(IPC1-7):H01L21/70 主分类号 H01L21/3105
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