发明名称 HANDOTAISOCHI
摘要 PURPOSE:To improve performance at a high speed by making a space between a gate and a drain longer than one between the gate and a source. CONSTITUTION:A depletion layer 11 is formed onto the surface of a channel layer 2, the whole region from a gate 7 to a dummy gate 8. Since a section between a source 3 and the gate 7 is shortened and parasitic resistance Rsg is reduced in the same manner as conventional devices, the decrease of mutual conductance gm can be inhibited while capacitance Cgd between the gate 7 and a drain 4 is lowered, and breakdown strength between the gate-drain 7, 4 can be increased. Even when gate length is brought to 0.8mum or less, a space between the source 3 and the drain 4 is lengthened because the dummy gate 8 is shaped, thus suppressing a short channel effect. Accordingly, performance at high speed is improved.
申请公布号 JP2659065(B2) 申请公布日期 1997.09.30
申请号 JP19880069444 申请日期 1988.03.25
申请人 HITACHI SEISAKUSHO KK 发明人 HATSUTA YASUSHI
分类号 H01L21/338;H01L29/41;H01L29/812;(IPC1-7):H01L21/338 主分类号 H01L21/338
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