Timing generator for multi standard oscillator used in semiconductor tester

摘要

The generator operates based on contents of a data memory (21) and uses a counter (25) to carry out division of the oscillation signal received from a standard oscillator (20). The timing generation part includes an adder (22) which accumulates and sums up output from a periodic generator (2). When changing into set period Tm of the second oscillator from period Tn of the first oscillator is radix converting circuit (201) performs division of M/Tm, where M is previously set point from data memory. A COMP signal input end applying a supplementary numerical value -Tm is given to the adder.