发明名称 |
Humidity control thermal analyzer |
摘要 |
The humidity of the atmosphere contacting a sample and the water vapor partial pressure are program controlled and measured in a device having: a sample chamber which is provided with an inlet and an outlet for water vapor and which is capable of controlling a feedback temperature along with the sample stored therein; a warm water chamber for generating saturated water vapor pressure which has a gas inlet and an outlet connected to a pipe and which is capable of controlling the feedback temperature; a humidity program function generator for outputting a target humidity value for the sample chamber for each input time interval; a memory for storing a temperature-saturated water vapor pressure curve; and a calculator for calculating a control target temperature for the warm water chamber for generating the saturated water vapor pressure on the basis of the sample chamber target temperature output from a temperature program function generator, sample chamber target humidity of the sample chamber output from the humidity program function generator and the temperature-saturated water vapor pressure curve.
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申请公布号 |
US5669554(A) |
申请公布日期 |
1997.09.23 |
申请号 |
US19950561194 |
申请日期 |
1995.11.21 |
申请人 |
SEIKO INSTRUMENTS, INC. |
发明人 |
NAKAMURA, NOBUTAKA;KINOSHITA, RYOICHI |
分类号 |
G01N25/00;B01F3/02;G01N25/20;G01N25/48;G05D22/02;(IPC1-7):G01N25/00 |
主分类号 |
G01N25/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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