发明名称 SEMICONDUCTOR MEMORY DEVICE HAVING FAULTY CELLS
摘要 <p>A semiconductor memory device having an electrically erasable nonvolatile memory, wherein the nonvolatile memory has management information regions for individual blocks and fault registration regions for registering fault addresses. If a block is accessed and found to be faulty, the fault registration is performed so that a partially faulty memory can be used without an increase in access time. By registering the management information address for executing the interchanges of blocks in one-to-one correspondence in the administrative information region, moreover, the blocks can be interchanged depending upon the frequency of rewriting.</p>
申请公布号 WO1997032253(P1) 申请公布日期 1997.09.04
申请号 JP1996003501 申请日期 1996.11.29
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