发明名称 |
CONTROL MECHANISMS FOR DOSIMETRY CONTROL IN ION IMPLANTATION SYSTEMS |
摘要 |
A high throughput ion implantation system that rapidly and efficiently processes large quantities of flat panel displays. The ion implantation system has an ion source, an electrode assembly, a platform mounting a workpiece, and an ion beam measuring structure. The ion source in conjunction with the electrode assembly forms an ion beam in the shape of a ribbon beam. The ion beam is formed and directed such that a first portion of the ion beam treats the workpiece while a second portion of the ion beam is contemporaneously measured by the beam measuring structure. A controller obtains data from the beam measuring structure on the ion beam's parameters, and then generates control signals to the ion implantation system in response to the data. |
申请公布号 |
WO9732335(A2) |
申请公布日期 |
1997.09.04 |
申请号 |
WO1997US02412 |
申请日期 |
1997.02.14 |
申请人 |
EATON CORPORATION |
发明人 |
BLAKE, JULIAN, G.;SFERLAZZO, PIERO;ROSE, PETER, H.;BRAILOVE, ADAM, A. |
分类号 |
H01J37/04;C23C14/48;H01J27/14;H01J37/08;H01J37/18;H01J37/30;H01J37/304;H01J37/317;H01L21/00;H01L21/265;H01L21/677;H01L21/683 |
主分类号 |
H01J37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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