发明名称 MUSTER-KORREKTURVERFAHREN
摘要 The pattern correction technique includes a step of covering one surface of the substrate (12) including the pattern (20) with a protective film (60) for correction, a step of exposing the one surface of the substrate (12) at a part where a defect (30, 40, 50) exists, a step of filling the part of the exposed one surface of the substrate (12) with a correcting material (70) and a step of removing the protective film (60) for correction. Either one of the protective film (60) for correction and the correcting material (70) consists of a water-soluble material and the other consists of an oil-soluble material. @(19pp Dwg.No.1B,C/2)@.
申请公布号 DE68928200(D1) 申请公布日期 1997.09.04
申请号 DE1989628200 申请日期 1989.10.11
申请人 KYODO PRINTING CO., LTD., TOKIO/TOKYO, JP 发明人 FURUKAWA, TADAHIRO, BUNKYO-KU TOKYO 112, JP;KIKUCHI, TOSHIAKI, BUNKYO-KU TOKYO 112, JP;KONNO, HITOSHI, BUNKYO-KU TOKYO 112, JP
分类号 G02B5/20;G03F1/72;H01L21/027;H01L21/30 主分类号 G02B5/20
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