发明名称 TRANSISTOR INTEGRATED SEMICONDUCTOR OPTICAL DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a transistor integrated semiconductor optical detector with the reduced manufacturing cost and with no deterioration of a frequency response and further with a high speed operation in which optical detector a hetero bipolar transistor and a waveguide type semiconductor optical detector are integrated on the same semiconductor substrate. SOLUTION: A transistor integrated semiconductor optical detector includes a hetero bipolar transistor and a waveguide type semiconductor optical detector integrated on at least the same semiconductor substrate 1. In the optical detector, a base layer 4 of the hetero bipolar transistor is used as a first conductivity type contact layer in the waveguide type semiconductor optical detector, and likewise a collector layer 3 as an optical absorption layer, and a subcollector layer 2 as a second conductivity type contact layer. A bandgap wavelength of the subcollector layer 2 is set to be shorter than the wavelength of incident light into the waveguide type optical detector but longer than a bandgap wavelength of the semiconductor substrate 1.
申请公布号 JPH09223785(A) 申请公布日期 1997.08.26
申请号 JP19960028863 申请日期 1996.02.16
申请人 NEC CORP 发明人 TAKEUCHI TAKESHI;TAGUCHI KENSHIN
分类号 G02B6/122;H01L21/8222;H01L27/06;H01L27/14;H01L27/15;H01L29/205;H01L31/10;(IPC1-7):H01L27/14;H01L21/822 主分类号 G02B6/122
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