发明名称 HIGH-MOLECULAR COMPOUND, AND PHOTOSENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To obtain a photosensitive resin compsn. excellent in the capability of forming a fine pattern by compounding a specific high-molecular compd. having sites formed by bonding specific alkoxy groups to carboxyl groups with a photoinduced acid generator. SOLUTION: This resin compsn. comprises 75-99.8wt.% high-molecular compd. having a wt.-average mol.wt. of 1,000-1,000,000 and represented by formula I (wherein R<1> , R<3> , and R<7> are each H or methyl; R<2> is a bridged cyclic hydrocarbon group; R<4> is H or a 1-2C hydrocarbon group; R<5> is 1-2C hydrocarbon group; R<6> is a 1-12C hydrocarbon group optionally substd. by an alkoxy group, etc.; x is 0.1-0.9; y is 0.1-0.7; and z is 0-0.7 provided x+y+z=1) and 0.2-25wt.% photoinduced acid generator. Since the site represented by formula II in the compd. represented by formula I can be easily decomposed by a hot acid, a scumless fine resist pattern is obtd. which enables resolving at a low exposure in ArF excimer laser lithography and enables the use of a photoinduced acid generator generating a weak acid.
申请公布号 JPH09221526(A) 申请公布日期 1997.08.26
申请号 JP19960309742 申请日期 1996.11.20
申请人 NEC CORP 发明人 IWASA SHIGEYUKI;MAEDA KATSUMI;NAKANO KAICHIRO;HASEGAWA ETSUO
分类号 C08F220/04;C08F220/06;C08F220/10;C08F220/18;C08F220/26;C08F220/28;C09D133/04;C09D133/14;G03F7/004;G03F7/039;H01L21/027;(IPC1-7):C08F220/28 主分类号 C08F220/04
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