METHOD FOR INSPECTING INTERNAL DEFECT OF OBJECT HAVING ELECTROSTRICTIVE PHENOMENON,申请号JP19960048278-传众专利搜索

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发明名称	METHOD FOR INSPECTING INTERNAL DEFECT OF OBJECT HAVING ELECTROSTRICTIVE PHENOMENON
摘要
申请公布号	JPH09218173(A)	申请公布日期	1997.08.19
申请号	JP19960048278	申请日期	1996.02.09
申请人	TAIYO YUDEN CO LTD	发明人	NAKAJIMA MASAICHI
分类号	G01N27/00;(IPC1-7):G01N27/00	主分类号	G01N27/00
代理机构		代理人
主权项
地址

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