A method for reduction of selected ion intensities in confined ion beams

摘要

The present invention relates generally to a method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions. More specifically, the method has steps resulting in selectively neutralizing carrier gas ions. Apparatus for providing an ion beam having an increased proportion of analyte ions compared to carrier gas ions, comprising: (a) an ion source for providing a beam comprising a mixture of carrier gas ions and analyte ions, (b) means for exposing said mixture to a reagent gas comprising hydrogen gas so that charge is selectively transferred from the carrier gas ions to the hydrogen gas, thereby neutralizing the carrier gas ions and forming charged hydrogen gas.