发明名称 Method for manufacturing thin film, and deposition apparatus
摘要 <p>A deposition apparatus of the present invention is arranged so that a surface area of a radio-frequency power applying cathode electrode disposed in a glow discharge space, in a space in contact with discharge is greater than a surface area of the whole of a ground electrode (anode electrode) including a beltlike member in the discharge space. This structure can maintain the potential (self-bias) of the cathode electrode disposed in the glow discharge space automatically at a positive potential with respect to the ground (anode) electrode including the beltlike member. As a result, the bias is applied in the direction of irradiation of ions with positive charge to a deposit film on the beltlike member, so that the ions existing in the plasma discharge are accelerated more efficiently toward the beltlike member, thereby effectively giving energy to the surface of deposit film by ion bombardment. Accordingly, since the structural relaxation of film is promoted even at relatively high deposition rates, a microcrystal semiconductor film can be formed at the relatively high deposition rates with good efficiency, with high uniformity, and with good reproducibility. <IMAGE></p>
申请公布号 EP0786795(A2) 申请公布日期 1997.07.30
申请号 EP19970100414 申请日期 1997.01.13
申请人 CANON KABUSHIKI KAISHA 发明人 KOHDA, YUZO;OKABE, SHOTARO;KANAI, MASAHIRO;SAKAI, AKIRA;HORI, TADASHI;NISHIMOTO, TOMONORI;YAJIMA, TAKAHIRO
分类号 G03G5/08;C23C16/50;C23C16/54;H01J37/32;H01L21/205;H01L31/04;H01L31/20;(IPC1-7):H01J37/32 主分类号 G03G5/08
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