发明名称 WAFER POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a wafer polishing device capable of stably providing wafers having excellent flatness. SOLUTION: This wafer polishing device has a surface plate 3 over which abrasive cloth 2 is stretched, a polishing head 4 provided above a position off the center of the surface plate 3, and a plate 7 installed below the polishing head 7; on the plate 7, a carrier 6 provided with a backing pad 12 for pressing a wafer W and designed to be capable of carrying the plurality of wafers W is provided in such a way as to be freely rotatable with respect to the plate 7, so that the wafer W is polished as it is rotated around the plate 7 while revolving on its own axis.
申请公布号 JPH09183063(A) 申请公布日期 1997.07.15
申请号 JP19950353987 申请日期 1995.12.28
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 HASEGAWA FUMIHIKO;KOBAYASHI MAKOTO;SUZUKI FUMIO
分类号 B24B37/04;B24B37/27;B24B37/28;B24B37/30;H01L21/304 主分类号 B24B37/04
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