DIE TEST CIRCUIT,申请号KR19910000177U-传众专利搜索

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发明名称	DIE TEST CIRCUIT
摘要
申请公布号	KR970007074(Y1)	申请公布日期	1997.07.15
申请号	KR19910000177U	申请日期	1991.01.09
申请人	LG SEMICONDUCTOR CO.,LTD	发明人	KIM, CHAE-SUB
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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