发明名称 Verfahren zur Herstellung eines Halbleiterlasers
摘要 After the epitaxial growth of a first semiconductor layer on a semiconductor substrate, an insulating film structure is formed on the layer. Sections of the first semiconductor layer are removed by wet etching, using the insulating film structure as a mask in order to maintain a land with a reversed mesa shape. Then opposite end sections of the insulating film structure are etched away to match the insulating film structure to the width of the land. Then a second semiconductor layer is epitaxially grown on opposite sides of the land, and a third semiconductor layer is epitaxially grown on the land and the second semiconductor layer.
申请公布号 DE4240539(C2) 申请公布日期 1997.07.03
申请号 DE19924240539 申请日期 1992.12.02
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 KANENO, NOBUAKI, ITAMI, HYOGO, JP;KIZUKI, HIROTAKA, ITAMI, HYOGO, JP;HAYAFUJI, NORIO, ITAMI, HYOGO, JP;SHIBA, TETSUO, ITAMI, HYOGO, JP;TADA, HITOSHI, ITAMI, HYOGO, JP
分类号 H01L21/20;H01L21/308;H01S5/20;H01S5/223;H01S5/227;H01S5/323;(IPC1-7):H01S3/19;H01L21/306;H01L21/205 主分类号 H01L21/20
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