MEASUREMENT APPARATUS AND METHOD OF ENERGY GAP OF SEMICONDUCTOR

摘要

The method and apparatus for displaying thermal characteristics of an energy gap by using an optic system and an image system consists of a cryostat(100) holding temperature of a semiconductor reagent low, a light projection unit(200) emitting light having a specified bandwidth on the semiconductor reagent in the cryostat(4) and an image processing unit(300) for processing an image and displaying a degree of its absorption and transparency.