发明名称 Preconditioning process for treating deposition chamber prior to deposition of tungsten silicide coating on active substrates therein
摘要 <p>A process is disclosed for preconditioning surfaces of a tungsten silicide deposition chamber, after a previous step of cleaning the chamber, and prior to depositing tungsten silicide on active substrates in the chamber, which first comprises treating the chamber surfaces with a gaseous silicon source, such as silane, and a tungsten-bearing gas, such as WF6, to form a first deposition of a silane-based tungsten silicide on the chamber surfaces. In a preferred embodiment, the preconditioning process further comprises subsequently treating the already coated chamber surfaces in a second step with a mixture of a tungsten-bearing gas, such as WF6, and a chlorine-substituted silane such as dichlorosilane (SiH2Cl2), monochlorosilane (SiH3Cl), or trichlorosilane (SiHCl3) to form a chlorine-substituted silane-based tungsten silicide deposition over the previous deposited tungsten silicide, prior to commencement of depositing tungsten silicide on active substrates in the deposition chamber.</p>
申请公布号 EP0780488(A1) 申请公布日期 1997.06.25
申请号 EP19960120475 申请日期 1996.12.19
申请人 APPLIED MATERIALS, INC. 发明人 TELFORD, SUSAN WEIHER;ARUGA, MICHIO;CHANG, MEI
分类号 C01G41/00;C01B33/06;C23C16/02;C23C16/42;C23C16/44;H01L21/285;(IPC1-7):C23C16/42 主分类号 C01G41/00
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