发明名称 |
SEMICONDUCTOR STORAGE DEVICE AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To increase the surface ratio of a storage node electrode contributing to an increase in capacitance. SOLUTION: A storage node electrode 134 is connected to a contact plug 117A through an upper node contact hole 124. A lower cell plate electrode composed of an N-type silicon film 123 and an N-type silicon film spacer 126 is covered with the storage node electrode 134 through the intermediary of a titanium oxide film 129a which serves as a lower capacity insulating film, and an upper cell plate electrode formed of an N-type silicon film 145 connected to the lower cell plate electrode is made to cover the storage node electrode 134 through the intermediary of a titanium oxide film 139 which serves as an upper capacity insulating film. |
申请公布号 |
JPH09167831(A) |
申请公布日期 |
1997.06.24 |
申请号 |
JP19950325469 |
申请日期 |
1995.12.14 |
申请人 |
NEC CORP |
发明人 |
KOYAMA KUNIAKI;JIYON MAAKU DORAINAN |
分类号 |
H01L27/04;H01L21/822;H01L21/8242;H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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