发明名称 SEMICONDUCTOR STORAGE DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To increase the surface ratio of a storage node electrode contributing to an increase in capacitance. SOLUTION: A storage node electrode 134 is connected to a contact plug 117A through an upper node contact hole 124. A lower cell plate electrode composed of an N-type silicon film 123 and an N-type silicon film spacer 126 is covered with the storage node electrode 134 through the intermediary of a titanium oxide film 129a which serves as a lower capacity insulating film, and an upper cell plate electrode formed of an N-type silicon film 145 connected to the lower cell plate electrode is made to cover the storage node electrode 134 through the intermediary of a titanium oxide film 139 which serves as an upper capacity insulating film.
申请公布号 JPH09167831(A) 申请公布日期 1997.06.24
申请号 JP19950325469 申请日期 1995.12.14
申请人 NEC CORP 发明人 KOYAMA KUNIAKI;JIYON MAAKU DORAINAN
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/108 主分类号 H01L27/04
代理机构 代理人
主权项
地址