发明名称 LABEL FOR SEMICONDUCTOR WAFER
摘要 <p>PROBLEM TO BE SOLVED: To provide a label for semiconductor wafer whereby the wafer is identifiable, without taking it out of a wafer cassette. SOLUTION: A label 15 for identifying a wafer 11 for use in production of a semiconductor device is composed of at least one recessed mark at an edge 13 of a flat zone A of the wafer 11. A lot number and wafer number composed of characters and figures indicated on the surface of a region adjacent to the mark are further indicated to more easily identify the wafer 11. Since the wafer need not be taken out from a wafer cassette to recognize the number of the wafer, the wafer is prevented from being scratched on the surface, thus reducing the damage and contamination of the wafer 11.</p>
申请公布号 JPH09162085(A) 申请公布日期 1997.06.20
申请号 JP19960236605 申请日期 1996.09.06
申请人 SAMSUNG ELECTRON CO LTD 发明人 RI ZAIJIYOU;RI CHINSHIYAKU;KIN NANTETSU;RI SHIYOUEN
分类号 H01L21/02;G09F3/00;H01L23/544;(IPC1-7):H01L21/02 主分类号 H01L21/02
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