发明名称 METHOD AND EQUIPMENT FOR THREE-DIMENSIONAL MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To ensure highly accurate high resolution three-dimensional measurement even when the reflectance of object is uneven and to realize high degree of freedom in the setting of measuring distance. SOLUTION: The three-dimensional measuring equipment comprises means for scanning an object Q optically by projecting a detection light U, and an image pickup means for receiving the detection light U reflected on the object Q. While varying the irradiating directionθa of detection light U toward the object Q, quantity of detection light U incident to a specified light receiving region (g) on an image pickup plane S2 is sampled periodically. Based on three or more sampling values, including a maximum sampling value and immediately preceding and following sampling values, an irradiation timing Npeak for maximizing the quantity of light is determined by interpolation. Subsequently, a part (ag) corresponding to the light receiving region (g) on the object Q is located based on the irradiating direction at that irradiation timing and the relationship between the light receiving region (g) and the incident direction of detection light.
申请公布号 JPH09145319(A) 申请公布日期 1997.06.06
申请号 JP19950299921 申请日期 1995.11.17
申请人 MINOLTA CO LTD 发明人 NORITA TOSHIO;FUJII HIDEO
分类号 G01B11/00;G01B11/24;G06T1/00;G06T7/00;(IPC1-7):G01B11/00 主分类号 G01B11/00
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