发明名称 Semiconductor device comprising a salicide structure
摘要 After formation a gate electrode and source/drain regions, N ions or O ions are implanted into a predetermined region using a resist mask, and a Ti layer is deposited on the entire face of a substrate, and then the Ti layer is silicided in self-alignment by a heat treatment, whereby a high resistivity TixNySiz mixing layer is formed the predetermined region on the gate electrode and the source/drain regions 10, and a low resistivity TiSi2 layer 12 is formed on another region.
申请公布号 US5635746(A) 申请公布日期 1997.06.03
申请号 US19950575194 申请日期 1995.12.20
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KIMURA, MASATOSHI;SUGIYAMA, MASAO
分类号 H01L29/78;H01L21/285;H01L21/336;H01L21/8234;H01L21/8238;(IPC1-7):H01L29/76 主分类号 H01L29/78
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