发明名称 High-density bond pad layout arrangements for semiconductor dies, and connecting to the bond pads
摘要 Composite bond pad structure and geometry increases bond pad density and reduces lift-off problems. Bond pad density is increased by laying out certain non-square bond pads which are shaped, sized and oriented such that each bond pad closely conforms to the shape of the contact footprint made therewith by a bond wire or lead frame lead and aligns to the approach angle of the conductive line to which it is connected. Alternating, interleaved, complementary wedge-shaped bond pads are discussed. Bond pad liftoff is reduced by providing an upper bond pad, a lower bond pad and an insulating component between the upper and lower bond pads. At least one opening is provided through the insulating component, extending from the bottom bond pad to the upper bond pad. The at least one opening is aligned with a peripheral region of the bottom bond pad and is filled with conductive material.
申请公布号 US5635424(A) 申请公布日期 1997.06.03
申请号 US19950430399 申请日期 1995.04.28
申请人 LSI LOGIC CORPORATION 发明人 ROSTOKER, MICHAEL D.;HEIM, DOROTHY A.
分类号 G03F7/20;G06F17/50;H01L23/31;H01L23/485;H01L23/495;H01L27/02;H01L29/06;(IPC1-7):H01L21/41 主分类号 G03F7/20
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