发明名称 TEST CIRCUIT FOR SERIES COMPENSATING DEVICE
摘要 PROBLEM TO BE SOLVED: To test a series compensating device by small-scaled facility by connecting a charger and a reactor in parallel with a series compensating device through the medium of switches. SOLUTION: A test circuit is constituted by connecting, in parallel with a series compensating device 10, a reactor 15 through the medium of a switch 17, and a charger 16 through the medium of a switch 18. The series compensating device 10 is composed by connecting a series capacitor 11, an overvoltage protecting element 12, and a series circuit of a reactor 13 and semiconductor switch 14 in parallel respectively. A charger 16 charges a series capacitor 11 with a switch 17 released and with a switch 18 on. When the switch 18 is released and the switch 17 is turned on after the completion of the charging, a resonance current flows in a circuit composed of the series compensating device 10 and the reactor 15. Since the current capacity of the charger 16 is smaller than a test current, it becomes possible to make the capacity of a power source smaller than that of the series capacitor 11, and to reduce the capacity of the facility and the size.
申请公布号 JPH09140062(A) 申请公布日期 1997.05.27
申请号 JP19950298077 申请日期 1995.11.16
申请人 HITACHI LTD 发明人 KIDA JUNZO;KONDO SHINICHI;ARITA HIROSHI
分类号 G01R31/00;H02J3/18 主分类号 G01R31/00
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