| 摘要 |
The method is characterized by including the steps of: connecting each input pin of a semiconductor device to a test driver(T1), and applying a signal according to a function test input level(VIH, VIL) of High/Low state to the test driver(T1); determining good quality/bad quality by inputting an output level according to the function test input level outputted from the semiconductor device to a CPU; and passing open/short test in case of good quality, and otherwise determining whether a bad function quality or bad open/short quality. |
