发明名称 |
PROCESSING METHOD OF WAFER |
摘要 |
PROBLEM TO BE SOLVED: To accurately form a channel plate by exposing parts of a substrate on which a silicon nitride film is formed by patterning the nitride film and forming V-shaped grooves by etching the exposed parts. SOLUTION: After a silicon nitride layer 141 is formed on a substrate 11 through a thermally nitriding process and parts of the substrate 11 are exposed by patterning the nitride layer 141 while the temperature of the layer 141 is maintained at 900-1,200 deg.C under the atmospheric pressure in a nitrogen atmosphere or a mixed atmosphere of nitrogen and ammonia. Then V-shaped grooves 15 and 13 are formed simultaneously with a tapered channel 17 by etching the exposed parts with a KOH etchant. Therefore, a channel plate can be formed accurately. |
申请公布号 |
JPH09129593(A) |
申请公布日期 |
1997.05.16 |
申请号 |
JP19960242816 |
申请日期 |
1996.09.13 |
申请人 |
LE-SENTO TECHNOL INC |
发明人 |
CHIYAARUZU UORUTAA PIAASU |
分类号 |
B41J2/175;B41J2/16;H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
B41J2/175 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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