发明名称 PROCESSING METHOD OF WAFER
摘要 PROBLEM TO BE SOLVED: To accurately form a channel plate by exposing parts of a substrate on which a silicon nitride film is formed by patterning the nitride film and forming V-shaped grooves by etching the exposed parts. SOLUTION: After a silicon nitride layer 141 is formed on a substrate 11 through a thermally nitriding process and parts of the substrate 11 are exposed by patterning the nitride layer 141 while the temperature of the layer 141 is maintained at 900-1,200 deg.C under the atmospheric pressure in a nitrogen atmosphere or a mixed atmosphere of nitrogen and ammonia. Then V-shaped grooves 15 and 13 are formed simultaneously with a tapered channel 17 by etching the exposed parts with a KOH etchant. Therefore, a channel plate can be formed accurately.
申请公布号 JPH09129593(A) 申请公布日期 1997.05.16
申请号 JP19960242816 申请日期 1996.09.13
申请人 LE-SENTO TECHNOL INC 发明人 CHIYAARUZU UORUTAA PIAASU
分类号 B41J2/175;B41J2/16;H01L21/306;(IPC1-7):H01L21/306 主分类号 B41J2/175
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