发明名称 Semiconductor device comprising an over-temperature detection element for detecting excessive temperatures amplifiers
摘要 A semiconductor device includes on a semiconductor substrate an output transistor which is composed of a collector region, a first base region and a first emitter region, and a temperature detection transistor composed of the collector region, a second base region and a second emitter region. The output transistor is provided at a center of the collector region of the semiconductor substrate. A vacant region is formed on a center of the output transistor, and the temperature detection transistor is provided in the vacant region.
申请公布号 US5629551(A) 申请公布日期 1997.05.13
申请号 US19950503688 申请日期 1995.07.18
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NAKURA, HIDEAKI;YOKOZAWA, MASAMI;TSUBAKI, KAZUHIKO;YOSHIMURA, MASASUKE
分类号 H01L27/02;(IPC1-7):H01L29/47;H01L29/812;H01L27/095 主分类号 H01L27/02
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