发明名称 Test socket for an integrated circuit
摘要 A socket has a main socket body 10 and a plurality of contact members 12 adapted for making electrical contact with electrical parts (20, 30) of both small outline package (SOP) type and small outline J-leaded package (SOJ) type. The contact members 12 have a base part 12a that is fixed in the main socket body, a contact part (12d, 12e and 12f) which guides and makes pressure contact with the connection terminals (22, 32) of the electrical part (20, 30) and a connective part 12c which integrally connects the base part (12a) and the contact part (12d, 12e and 12f). Each contact also includes a spring reinforcement and current bypass part (12h). The contact part further includes an upper guide portion (12f), a lower guide portion (12d) and a contact portion (12e).
申请公布号 US5628635(A) 申请公布日期 1997.05.13
申请号 US19950400208 申请日期 1995.03.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 IKEYA, KIYOKAZU
分类号 H01L21/66;H01L23/32;H01R33/76;H05K7/10;(IPC1-7):H01R9/09 主分类号 H01L21/66
代理机构 代理人
主权项
地址